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  1. Article ; Online: X-ray mirrors with sub-nanometre figure errors obtained by differential deposition of thin WSi

    Bras, Patrice / Morawe, Christian / Labouré, Sylvain / Perrin, François / Vivo, Amparo / Barrett, Raymond

    Journal of synchrotron radiation

    2023  Volume 30, Issue Pt 4, Page(s) 708–716

    Abstract: ... of X-ray mirrors to be deployed on low-emittance synchrotron beamlines. During the deposition process ...

    Abstract Differential deposition by DC magnetron sputtering was applied to correct for figure errors of X-ray mirrors to be deployed on low-emittance synchrotron beamlines. During the deposition process, the mirrors were moved in front of a beam-defining aperture and the required velocity profile was calculated using a deconvolution algorithm. The surface figure was characterized using conventional off-line visible-light metrology instrumentation (long trace profiler and Fizeau interferometer) before and after the deposition. WSi
    MeSH term(s) X-Rays ; Radiography ; Algorithms ; Synchrotrons
    Language English
    Publishing date 2023-05-30
    Publishing country United States
    Document type Journal Article
    ZDB-ID 2021413-3
    ISSN 1600-5775 ; 0909-0495
    ISSN (online) 1600-5775
    ISSN 0909-0495
    DOI 10.1107/S1600577523003697
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  2. Article ; Online: Fabrication of ultrashort sub-meter-radius x-ray mirrors using dynamic stencil deposition with figure correction.

    Shimamura, Takenori / Takeo, Yoko / Kimura, Takashi / Perrin, François / Vivo, Amparo / Senba, Yasunori / Kishimoto, Hikaru / Ohashi, Haruhiko / Mimura, Hidekazu

    The Review of scientific instruments

    2023  Volume 94, Issue 4

    Abstract: This paper presents nanometer-scale production and metrology methods for elliptic-cylindrical x-ray ... and x-ray ptychography. The x-ray focusing profile is diffraction-limited with a 142-nm focus size ... of highly curved mirrors, thus benefiting nanoscale photon-hungry x-ray techniques. ...

    Abstract This paper presents nanometer-scale production and metrology methods for elliptic-cylindrical x-ray mirrors with an unprecedentedly small tangential radius of curvature of 160 mm. Sub-millimeter-scale figure correction is conducted based on dynamic stencil deposition. The deposition flux through one or two shadow masks is examined by a comparison to a simple model. The masked deposition flux distribution is improved, leading to film thickness profiles that are 50 times sharper in terms of aspect ratio than those obtained using existing differential deposition approaches. Surface roughness deterioration is also effectively suppressed. A 2-mm-long 160-mm-radius mirror is produced with a width of 10 mm and measured using simple interferometry. The results are confirmed by conventional mirror metrology, contact profilometry, and x-ray ptychography. The x-ray focusing profile is diffraction-limited with a 142-nm focus size at a photon energy of 300 eV. The proposed methods have the potential to enhance the ultraprecise fabrication of highly curved mirrors, thus benefiting nanoscale photon-hungry x-ray techniques.
    Language English
    Publishing date 2023-12-12
    Publishing country United States
    Document type Journal Article
    ZDB-ID 209865-9
    ISSN 1089-7623 ; 0034-6748
    ISSN (online) 1089-7623
    ISSN 0034-6748
    DOI 10.1063/5.0135367
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  3. Article ; Online: Controlled Synthesis of Gold Nanoparticles in Copolymers Nanomolds by X-ray Radiolysis.

    Bondaz, Louis / Fontaine, Philippe / Muller, François / Pantoustier, Nadège / Perrin, Patrick / Morfin, Isabelle / Goldmann, Michel / Cousin, Fabrice

    Langmuir : the ACS journal of surfaces and colloids

    2020  Volume 36, Issue 22, Page(s) 6132–6144

    Abstract: We show by X-ray and neutron small-angle scattering that gold nanoparticles with controlled sizes ...

    Abstract We show by X-ray and neutron small-angle scattering that gold nanoparticles with controlled sizes and morphologies can be obtained by the metallic reduction of AuCl
    Language English
    Publishing date 2020-05-27
    Publishing country United States
    Document type Journal Article
    ZDB-ID 2005937-1
    ISSN 1520-5827 ; 0743-7463
    ISSN (online) 1520-5827
    ISSN 0743-7463
    DOI 10.1021/acs.langmuir.0c00554
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  4. Article ; Online: Exploiting synchrotron X-ray tomography for a novel insight into flax-fibre defects ultrastructure

    Quereilhac, Delphine / Pinsard, Lola / Guillou, Elouan / Fazzini, Marina / De Luycker, Emmanuel / Bourmaud, Alain / Abida, Marwa / Perrin, Jonathan / Weitkamp, Timm / Ouagne, Pierre

    Industrial Crops & Products. 2023 Aug., v. 198 p.116655-

    2023  

    Abstract: ... morphologically explored using synchrotron phase-contrast X-ray microtomography, a technique that displays a sharp ...

    Abstract Flax fibres are valuable reinforcements for tomorrow's composites. However, defects called kink-bands, which mainly appear on fibres during the extraction and transformation phases, might affect their mechanical properties. Defects induced pores within the kink-band are investigated in this work. They were morphologically explored using synchrotron phase-contrast X-ray microtomography, a technique that displays a sharp 3D representation of the pores. The study highlights the link between kink-bands and secondary cell wall ultrastructure. Pores are organised concentrically around the lumen, and their low thickness suggest that they are located at the interface between cellulose layers within S2 (G) layer. Moreover, the pores inclination with reference to the lumen axis follows the typical microfibrillar angle changes observed in the literature in the kink-band region. The volumes of the pores were measured, and a local increase in porosity was revealed in zones where defects are most severe along the fibre.
    Keywords cell walls ; cellulose ; flax ; micro-computed tomography ; porosity ; ultrastructure ; Flax fibres ; Kink-bands ; Pores ; X-ray tomography ; Synchrotron radiation
    Language English
    Dates of publication 2023-08
    Publishing place Elsevier B.V.
    Document type Article ; Online
    ZDB-ID 1132158-1
    ISSN 1872-633X ; 0926-6690
    ISSN (online) 1872-633X
    ISSN 0926-6690
    DOI 10.1016/j.indcrop.2023.116655
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  5. Book ; Online: Exploiting synchrotron X-ray tomography for a novel insight into flax-fibre defects ultrastructure

    Quereilhac, Delphine / Pinsard, Lola / Guillou, Elouan / Fazzini, Marina / De Luycker, Emmanuel / Bourmaud, Alain / Abida, Marwa / Perrin, Jonathan / Weitkamp, Timm / Ouagne, Pierre

    2023  

    Abstract: ... morphologically explored using synchrotron phase-contrast X-ray microtomography, a technique that displays a sharp ...

    Abstract Flax fibres are valuable reinforcements for tomorrow's composites. However, defects called kink-bands, which mainly appear on fibres during the extraction and transformation phases, might affect their mechanical properties. Defects induced pores, within the kink-band are investigated in this work. They were morphologically explored using synchrotron phase-contrast X-ray microtomography, a technique that displays a sharp 3D representation of the pores. The study highlights the link between kink-bands and secondary cell wall ultrastructure. Pores are organised concentrically around the lumen, and their low thickness suggest that they are located at the interface between cellulose layers within S2 (G) layer. Moreover, the pores inclination with reference to the lumen axis follows the typical microfibrillar angle changes observed in the literature in the kink-band region. The volumes of the pores were measured, and a local increase in porosity was revealed in zones where defects are most severe along the fibre.

    Comment: 12 pages, 6 figures. Accepted for publication in Industrial Crops and Products (ISSN 0926-6690)
    Keywords Physics - Applied Physics ; Condensed Matter - Materials Science
    Publishing date 2023-03-31
    Publishing country us
    Document type Book ; Online
    Database BASE - Bielefeld Academic Search Engine (life sciences selection)

    Full text online

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  6. Article ; Online: Measurement techniques to improve the accuracy of x-ray mirror metrology using stitching Shack-Hartmann wavefront sensors.

    Adapa, Bharath Reddy / Dovillaire, Guillaume / Vivo, Amparo / Perrin, Francois / Mayer, Rafael / Barrett, Raymond

    The Review of scientific instruments

    2021  Volume 92, Issue 11, Page(s) 113103

    Abstract: ... metrology of x-ray mirrors using a dedicated commercial instrument based on wavefront sensing techniques ... to measurements of strongly curved spherical and aspherical x-ray mirrors with intrinsic slope errors of the order ...

    Abstract We describe the development of specific measurement protocols to improve the accuracy of surface metrology of x-ray mirrors using a dedicated commercial instrument based on wavefront sensing techniques. This instrument, SHARPeR, uses measurements from a Shack-Hartmann wavefront sensor combined with a sub-aperture stitching method to provide two-dimensional maps of the surface slope errors and can measure curved mirrors above 1 m radii. In this paper, we describe the results of measurement methods developed on a SHARPeR system installed at the European Synchrotron (ESRF) to reduce the contribution of systematic errors to measurements of strongly curved spherical and aspherical x-ray mirrors with intrinsic slope errors of the order of 100-200 nrad rms. We demonstrate how this commercial integrated instrument can provide measurements of these mirrors with comparable accuracy to those measured with a long trace profiler.
    Language English
    Publishing date 2021-12-01
    Publishing country United States
    Document type Journal Article
    ZDB-ID 209865-9
    ISSN 1089-7623 ; 0034-6748
    ISSN (online) 1089-7623
    ISSN 0034-6748
    DOI 10.1063/5.0067871
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  7. Article ; Online: Stitching techniques for measuring X-ray synchrotron mirror topography.

    Vivo, A / Barrett, R / Perrin, F

    The Review of scientific instruments

    2019  Volume 90, Issue 2, Page(s) 21710

    Abstract: ... stringent specifications required for X-ray optical components for synchrotron and free-electron laser light ...

    Abstract Optical metrology and polishing techniques are continuously evolving to satisfy the increasingly stringent specifications required for X-ray optical components for synchrotron and free-electron laser light source beamlines. For both spherical and aspherical geometries, the most demanding applications may have target residual figure errors close to 1 nm. To achieve such specifications and maintain them in the optomechanical mount, it is critical to develop methods capable of measuring the topography of the optical surface over the clear aperture of the mirror. The European Synchrotron Radiation Facility optical metrology laboratory has developed a stitching tool initially aimed at measuring long flat mirrors up to 1 m long with a Fizeau interferometer. The system is routinely used providing 2D maps of the optical surface. The instrument capabilities have been extended to characterize moderately curved optics using a transmission flat element, and results obtained on a high quality spherical mirror with 120 m of radius of curvature are presented. As a novel approach of stitching application, the technique has been used to improve the measurement accuracy of the Fizeau interferometer when measuring short plane mirrors. Acquisition of 2D topographies on a short plane mirror by micro-stitching interferometry is also presented and discussed.
    Language English
    Publishing date 2019-02-21
    Publishing country United States
    Document type Journal Article
    ZDB-ID 209865-9
    ISSN 1089-7623 ; 0034-6748
    ISSN (online) 1089-7623
    ISSN 0034-6748
    DOI 10.1063/1.5063339
    Database MEDical Literature Analysis and Retrieval System OnLINE

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  8. Article: 3D Characterization of Sponge Cake as Affected by Freezing Conditions Using Synchrotron X-ray Microtomography at Negative Temperature.

    Zennoune, Amira / Latil, Pierre / Ndoye, Fatou-Toutie / Flin, Frederic / Perrin, Jonathan / Geindreau, Christian / Benkhelifa, Hayat

    Foods (Basel, Switzerland)

    2021  Volume 10, Issue 12

    Abstract: In this study, the microstructural evolution of a non-reactive porous model food (sponge cake) during freezing was investigated. Sponge cake samples were frozen at two different rates: slow freezing (0.3 °C ... ...

    Abstract In this study, the microstructural evolution of a non-reactive porous model food (sponge cake) during freezing was investigated. Sponge cake samples were frozen at two different rates: slow freezing (0.3 °C min
    Language English
    Publishing date 2021-11-24
    Publishing country Switzerland
    Document type Journal Article
    ZDB-ID 2704223-6
    ISSN 2304-8158
    ISSN 2304-8158
    DOI 10.3390/foods10122915
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  9. Article: Small angle x-ray scattering to investigate the specific surface of hydrated alginate microbeads

    Ghernaouti, F. / Perrin, A. / Causse, J. / Chandre, F. / Cornu, D. / Cambedouzou, J.

    Food hydrocolloids

    2022  Volume 127, Issue -, Page(s) 107498

    Language English
    Document type Article
    ZDB-ID 742742-6
    ISSN 0268-005X
    Database Current Contents Nutrition, Environment, Agriculture

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  10. Article: Small angle x-ray scattering to investigate the specific surface of hydrated alginate microbeads

    Ghernaouti, F. / Perrin, A. / Causse, J. / Chandre, F. / Cornu, D. / Cambedouzou, J.

    Food hydrocolloids. 2022 June, v. 127

    2022  

    Abstract: ... we used small angle x-ray scattering (SAXS) as a tool in order to determine the specific surface area (SSA ...

    Abstract Encapsulation of active substances in biopolymer beads becomes a widely developed approach to gain efficiency for many applications. However, the characterization of such aqueous materials in their early stage of production is very delicate regarding their textural properties. The classical tools such as gas adsorption and Hg porosimetry can hardly provide relevant information since they require the removal of water, which is yet a fundamental part of the sample that drives its structure. In this article, we used small angle x-ray scattering (SAXS) as a tool in order to determine the specific surface area (SSA) of alginate microbeads in solution. This has been made possible by a careful procedure of SAXS measurements, involving calibration samples, allowing writing intensities in absolute units. Therefore, the Porod limit theory was used to calculate the SSA from the scattering length contrast and the measured absolute intensity. In addition, we compared the SSA of microbeads obtained from pure water and from a widely used cell culture medium, and we followed the textural evolution of a water alginate sample during the first step of a gentle drying process. Our results show that SAXS should be considered as a valuable tool for physico-chemists and food formulators in order to extract in situ dimensional and textural information of hydrogels during the formulation. It enables them to figure out the real surface available for the sorption of additive or active molecules in the formulation of biopolymers such as alginates, empowering them to better control encapsulation processes.
    Keywords adsorption ; alginates ; biopolymers ; calibration ; cell culture ; culture media ; encapsulation ; hydrocolloids ; hydrogels ; microbeads ; porosimetry ; small-angle X-ray scattering ; surface area ; texture
    Language English
    Dates of publication 2022-06
    Publishing place Elsevier Ltd
    Document type Article
    ZDB-ID 742742-6
    ISSN 1873-7137 ; 0268-005X
    ISSN (online) 1873-7137
    ISSN 0268-005X
    DOI 10.1016/j.foodhyd.2022.107498
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