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Article: Rapid Uniformity Analysis of Fully Printed SWCNT-Based Thin Film Transistor Arrays via Roll-to-Roll Gravure Process.

Choi, Yunhyok / Jung, Younsu / Song, Reem / Park, Jinhwa / Parajuli, Sajjan / Shrestha, Sagar / Cho, Gyoujin / Kim, Byung-Sung

Nanomaterials (Basel, Switzerland)

2023  Volume 13, Issue 3

Abstract: The roll-to-roll (R2R) gravure process has the potential for manufacturing single-wall carbon nanotubes (SWCNT)-based thin film transistor (TFT) arrays on a flexible plastic substrate. A significant hurdle toward the commercialization of the R2R-printed ... ...

Abstract The roll-to-roll (R2R) gravure process has the potential for manufacturing single-wall carbon nanotubes (SWCNT)-based thin film transistor (TFT) arrays on a flexible plastic substrate. A significant hurdle toward the commercialization of the R2R-printed SWCNT-TFT array is the lack of a suitable, simple, and rapid method for measuring the uniformity of printed products. We developed a probing instrument for characterizing R2R gravure printed TFT, named PICR2R-TFT, for rapidly characterizing R2R-printed SWCNT-TFT array that can present a geographical distribution profile to pinpoint the failed devices in an SWCNT-TFT array. Using the newly developed PICR2R-TFT instrument, the current-voltage characteristics of the fabricated SWCNT-TFT devices could be correlated to various R2R-printing process parameters, such as channel length, roll printing length, and printing speed. Thus, by introducing a characterization tool that is reliable and fast, one can quickly optimize the R2R gravure printing conditions to enhance product uniformity, thereby maximizing the yield of printed SWCNT-TFT arrays.
Language English
Publishing date 2023-02-01
Publishing country Switzerland
Document type Journal Article
ZDB-ID 2662255-5
ISSN 2079-4991
ISSN 2079-4991
DOI 10.3390/nano13030590
Database MEDical Literature Analysis and Retrieval System OnLINE

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