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Article: Genetic mapping using a wheat multi-founder population reveals a locus on chromosome 2A controlling resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum

Lin, Min / Corsi, Beatrice / Ficke, Andrea / Tan, Kar-Chun / Cockram, James / Lillemo, Morten

Theoretical and applied genetics. 2020 Mar., v. 133, no. 3

2020

Abstract: KEY MESSAGE: A locus on wheat chromosome 2A was found to control field resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum. The necrotrophic fungal pathogen Parastagonospora nodorum is the causal ... ...

Abstract	KEY MESSAGE: A locus on wheat chromosome 2A was found to control field resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum. The necrotrophic fungal pathogen Parastagonospora nodorum is the causal agent of Septoria nodorum leaf blotch and glume blotch, which are common wheat (Triticum aestivum L.) diseases in humid and temperate areas. Susceptibility to Septoria nodorum leaf blotch can partly be explained by sensitivity to corresponding P. nodorum necrotrophic effectors (NEs). Susceptibility to glume blotch is also quantitative; however, the underlying genetics have not been studied in detail. Here, we genetically map resistance/susceptibility loci to leaf and glume blotch using an eight-founder wheat multiparent advanced generation intercross population. The population was assessed in six field trials across two sites and 4 years. Seedling infiltration and inoculation assays using three P. nodorum isolates were also carried out, in order to compare quantitative trait loci (QTL) identified under controlled conditions with those identified in the field. Three significant field resistance QTL were identified on chromosomes 2A and 6A, while four significant seedling resistance QTL were detected on chromosomes 2D, 5B and 7D. Among these, QSnb.niab-2A.3 for field resistance to both leaf blotch and glume blotch was detected in Norway and the UK. Colocation with a QTL for seedling reactions against culture filtrate from a Norwegian P. nodorum isolate indicated the QTL could be caused by a novel NE sensitivity. The consistency of this QTL for leaf blotch at the seedling and adult plant stages and culture filtrate infiltration was confirmed by haplotype analysis. However, opposite effects for the leaf blotch and glume blotch reactions suggest that different genetic mechanisms may be involved.
Keywords	Parastagonospora nodorum ; Triticum aestivum ; culture filtrates ; fungi ; haplotypes ; leaf blotch ; leaves ; loci ; mature plants ; pathogens ; quantitative traits ; seedlings ; wheat ; Norway
Language	English
Dates of publication	2020-03
Size	p. 785-808.
Publishing place	Springer Berlin Heidelberg
Document type	Article
Note	NAL-AP-2-clean
ZDB-ID	2170-2
ISSN	1432-2242 ; 0040-5752
ISSN (online)	1432-2242
ISSN	0040-5752
DOI	10.1007/s00122-019-03507-w
Database	NAL-Catalogue (AGRICOLA)

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Article ; Online: Genetic mapping using a wheat multi-founder population reveals a locus on chromosome 2A controlling resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum.

Lin, Min / Corsi, Beatrice / Ficke, Andrea / Tan, Kar-Chun / Cockram, James / Lillemo, Morten

TAG. Theoretical and applied genetics. Theoretische und angewandte Genetik

2020 Volume 133, Issue 3, Page(s) 785–808

Abstract: Key message: A locus on wheat chromosome 2A was found to control field resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum. The necrotrophic fungal pathogen Parastagonospora nodorum is the causal ... ...

Abstract	Key message: A locus on wheat chromosome 2A was found to control field resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum. The necrotrophic fungal pathogen Parastagonospora nodorum is the causal agent of Septoria nodorum leaf blotch and glume blotch, which are common wheat (Triticum aestivum L.) diseases in humid and temperate areas. Susceptibility to Septoria nodorum leaf blotch can partly be explained by sensitivity to corresponding P. nodorum necrotrophic effectors (NEs). Susceptibility to glume blotch is also quantitative; however, the underlying genetics have not been studied in detail. Here, we genetically map resistance/susceptibility loci to leaf and glume blotch using an eight-founder wheat multiparent advanced generation intercross population. The population was assessed in six field trials across two sites and 4 years. Seedling infiltration and inoculation assays using three P. nodorum isolates were also carried out, in order to compare quantitative trait loci (QTL) identified under controlled conditions with those identified in the field. Three significant field resistance QTL were identified on chromosomes 2A and 6A, while four significant seedling resistance QTL were detected on chromosomes 2D, 5B and 7D. Among these, QSnb.niab-2A.3 for field resistance to both leaf blotch and glume blotch was detected in Norway and the UK. Colocation with a QTL for seedling reactions against culture filtrate from a Norwegian P. nodorum isolate indicated the QTL could be caused by a novel NE sensitivity. The consistency of this QTL for leaf blotch at the seedling and adult plant stages and culture filtrate infiltration was confirmed by haplotype analysis. However, opposite effects for the leaf blotch and glume blotch reactions suggest that different genetic mechanisms may be involved.
MeSH term(s)	Ascomycota/pathogenicity ; Chromosome Mapping ; Chromosomes, Plant ; Disease Resistance/genetics ; Founder Effect ; Norway ; Phenotype ; Plant Diseases/genetics ; Plant Diseases/microbiology ; Plant Leaves/microbiology ; Quantitative Trait Loci ; Triticum/genetics ; Triticum/microbiology ; United Kingdom
Language	English
Publishing date	2020-01-29
Publishing country	Germany
Document type	Journal Article
ZDB-ID	2170-2
ISSN	1432-2242 ; 0040-5752
ISSN (online)	1432-2242
ISSN	0040-5752
DOI	10.1007/s00122-019-03507-w
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Article: Septoria Nodorum Blotch of Wheat: Disease Management and Resistance Breeding in the Face of Shifting Disease Dynamics and a Changing Environment

Downie, Rowena C. / Lin, Min / Corsi, Beatrice / Ficke, Andrea / Lillemo, Morten / Oliver, Richard P. / Phan, Huyen T. T. / Tan, Kar-Chun / Cockram, James

Phytopathology. 2021 June, v. 111, no. 6

2021

Abstract: The fungus Parastagonospora nodorum is a narrow host range necrotrophic fungal pathogen that causes Septoria nodorum blotch (SNB) of cereals, most notably wheat (Triticum aestivum). Although commonly observed on wheat seedlings, P. nodorum infection has ... ...

Abstract	The fungus Parastagonospora nodorum is a narrow host range necrotrophic fungal pathogen that causes Septoria nodorum blotch (SNB) of cereals, most notably wheat (Triticum aestivum). Although commonly observed on wheat seedlings, P. nodorum infection has the greatest effect on the adult crop. It results in leaf blotch, which limits photosynthesis and thus crop growth and yield. It can also affect the wheat ear, resulting in glume blotch, which directly affects grain quality. Reports of P. nodorum fungicide resistance, the increasing use of reduced tillage agronomic practices, and high evolutionary potential of the pathogen, combined with changes in climate and agricultural environments, mean that genetic resistance to SNB remains a high priority in many regions of wheat cultivation. In this review, we summarize current information on P. nodorum population structure and its implication for improved SNB management. We then review recent advances in the genetics of host resistance to P. nodorum and the necrotrophic effectors it secretes during infection, integrating the genomic positions of these genetic loci by using the recently released wheat reference genome assembly. Finally, we discuss the genetic and genomic tools now available for SNB resistance breeding and consider future opportunities and challenges in crop health management by using the wheat–P. nodorum interaction as a model.
Keywords	Parastagonospora nodorum ; Triticum aestivum ; adults ; climate ; disease control ; fungi ; fungicide resistance ; genetic resistance ; genome assembly ; genomics ; grain quality ; host range ; leaf blotch ; models ; pathogens ; photosynthesis ; plant pathology ; population structure ; reduced tillage ; wheat
Language	English
Dates of publication	2021-06
Size	p. 906-920.
Publishing place	The American Phytopathological Society
Document type	Article
ZDB-ID	208889-7
ISSN	1943-7684 ; 0031-949X
ISSN (online)	1943-7684
ISSN	0031-949X
DOI	10.1094/PHYTO-07-20-0280-RVW
Database	NAL-Catalogue (AGRICOLA)

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Article ; Online: Genetic Dissection of Resistance to the Three Fungal Plant Pathogens

Stadlmeier, Melanie / Jørgensen, Lise Nistrup / Corsi, Beatrice / Cockram, James / Hartl, Lorenz / Mohler, Volker

G3 (Bethesda, Md.)

2019 Volume 9, Issue 5, Page(s) 1745–1757

Abstract: Bread wheat ( ...

Abstract	Bread wheat (
MeSH term(s)	Ascomycota ; Chromosome Mapping ; Disease Resistance/genetics ; Genetics, Population ; Host-Pathogen Interactions/genetics ; Phenotype ; Plant Diseases/genetics ; Plant Diseases/microbiology ; Quantitative Trait Loci ; Triticum/genetics ; Triticum/microbiology
Language	English
Publishing date	2019-05-07
Publishing country	United States
Document type	Journal Article ; Research Support, Non-U.S. Gov't
ZDB-ID	2629978-1
ISSN	2160-1836 ; 2160-1836
ISSN (online)	2160-1836
ISSN	2160-1836
DOI	10.1534/g3.119.400068
Database	MEDical Literature Analysis and Retrieval System OnLINE

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Article ; Online: Longer epidermal cells underlie a quantitative source of variation in wheat flag leaf size

Zanella, Camila M. / Rotondo, Marilena / McCormick‐Barnes, Charlie / Mellers, Greg / Corsi, Beatrice / Berry, Simon / Ciccone, Giulia / Day, Rob / Faralli, Michele / Galle, Alexander / Gardner, Keith A. / Jacobs, John / Ober, Eric S. / Sánchez del Rio, Ana / Van Rie, Jeroen / Lawson, Tracy / Cockram, James

New Phytologist. 2023 Mar., v. 237, no. 5 p.1558-1573

2023

Abstract: The wheat flag leaf is the main contributor of photosynthetic assimilates to developing grains. Understanding how canopy architecture strategies affect source strength and yield will aid improved crop design. We used an eight‐founder population to ... ...

Abstract	The wheat flag leaf is the main contributor of photosynthetic assimilates to developing grains. Understanding how canopy architecture strategies affect source strength and yield will aid improved crop design. We used an eight‐founder population to investigate the genetic architecture of flag leaf area, length, width and angle in European wheat. For the strongest genetic locus identified, we subsequently created a near‐isogenic line (NIL) pair for more detailed investigation across seven test environments. Genetic control of traits investigated was highly polygenic, with colocalisation of replicated quantitative trait loci (QTL) for one or more traits identifying 24 loci. For QTL QFll.niab‐5A.1 (FLL5A), development of a NIL pair found the FLL5A+ allele commonly conferred a c. 7% increase in flag and second leaf length and a more erect leaf angle, resulting in higher flag and/or second leaf area. Increased FLL5A‐mediated flag leaf length was associated with: (1) longer pavement cells and (2) larger stomata at lower density, with a trend for decreased maximum stomatal conductance (Gₛₘₐₓ) per unit leaf area. For FLL5A, cell size rather than number predominantly determined leaf length. The observed trade‐offs between leaf size and stomatal morphology highlight the need for future studies to consider these traits at the whole‐leaf level.
Keywords	alleles ; canopy ; leaf angle ; leaf area ; leaf length ; leaves ; loci ; pavements ; photosynthesis ; quantitative traits ; stomatal conductance ; wheat
Language	English
Dates of publication	2023-03
Size	p. 1558-1573.
Publishing place	John Wiley & Sons, Ltd
Document type	Article ; Online
Note	JOURNAL ARTICLE
ZDB-ID	208885-x
ISSN	1469-8137 ; 0028-646X
ISSN (online)	1469-8137
ISSN	0028-646X
DOI	10.1111/nph.18676
Database	NAL-Catalogue (AGRICOLA)

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Article: Hidden in plain sight: a molecular field survey of three wheat leaf blotch fungal diseases in North-Western Europe shows co-infection is widespread

Justesen, Annemarie Fejer / Corsi, Beatrice / Ficke, Andrea / Hartl, Lorenz / Holdgate, Sarah / Jørgensen, Lise Nistrup / Lillemo, Morten / Lin, Min / Mackay, Ian J. / Mohler, Volker / Stadlmeier, Melanie / Tan, Kar-Chun / Turner, Judith / Oliver, Richard P. / Cockram, James

European journal of plant pathology. 2021 Aug., v. 160, no. 4

2021

Abstract: Wheat (Triticum aestivum L.) yields are commonly affected by foliar infection by fungal pathogens. Of these, three wheat leaf blotch fungal diseases, septoria nodorum blotch (SNB), tan spot (TS) and septoria tritici blotch (STB), caused by ... ...

Abstract	Wheat (Triticum aestivum L.) yields are commonly affected by foliar infection by fungal pathogens. Of these, three wheat leaf blotch fungal diseases, septoria nodorum blotch (SNB), tan spot (TS) and septoria tritici blotch (STB), caused by Parastagonospora nodorum (Pn), Pyrenophora tritici-repentis (Ptr) and Zymoseptoria tritici (Zt), respectively, induce major yield losses. Infection results in necrotic areas on the leaf, and it is often difficult to determine the underlying causative pathogen from visible symptoms alone, especially in mixed infections. Here, a regional survey of 330 wheat samples collected across three seasons (years 2015–2017) from four north-west European countries was undertaken. Using quantitative polymerase chain reaction (qPCR) assays specific for each pathogen, as well as disease assessment of leaf materials, distinct regional differences were identified. Two-thirds (65%) of all samples harbored at least two of the three pathogens. Norway had high SNB abundance, but also showed mixed infections of SNB, TS and STB. In Germany, TS was prevalent, with STB also common. Danish samples commonly possessed all three pathogens, with STB prevalent, followed by TS and SNB. The UK had a major prevalence of STB with minimal occurrence of TS and SNB. Across all samples, qPCR identified Zt, Pn and Ptr in 90%, 54% and 57% of samples, respectively. For each pathogen, average disease levels via visual assessment showed modest positive correlation with fungal DNA concentrations (R² = 0.13–0.32). Overall, our study highlights that the occurrence of mixed infection is common and widespread, with important implications for wheat disease management and breeding strategies.
Keywords	DNA ; Mycosphaerella graminicola ; Parastagonospora nodorum ; Pyrenophora tritici-repentis ; Triticum aestivum ; disease control ; fungi ; leaf blotch ; leaves ; mixed infection ; pathogens ; plant pathology ; quantitative polymerase chain reaction ; regional surveys ; wheat ; Germany ; Northern European region ; Norway
Language	English
Dates of publication	2021-08
Size	p. 949-962.
Publishing place	Springer Netherlands
Document type	Article
ZDB-ID	1196520-4
ISSN	0929-1873
ISSN	0929-1873
DOI	10.1007/s10658-021-02298-5
Database	NAL-Catalogue (AGRICOLA)

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Article: Identification of eight QTL controlling multiple yield components in a German multi-parental wheat population, including Rht24, WAPO-A1, WAPO-B1 and genetic loci on chromosomes 5A and 6A

Corsi, Beatrice / Obinu, Lia / Zanella, Camila M / Cutrupi, Saverio / Day, Rob / Geyer, Manuel / Lillemo, Morten / Lin, Min / Mazza, Lorenzo / Percival-Alwyn, Lawrence / Stadlmeier, Melanie / Mohler, Volker / Hartl, Lorenz / Cockram, James

Theoretical and applied genetics. 2021 May, v. 134, no. 5

2021

Abstract: KEY MESSAGE: Quantitative trait locus (QTL) mapping of 15 yield component traits in a German multi-founder population identified eight QTL each controlling ≥2 phenotypes, including the genetic loci Rht24, WAPO-A1 and WAPO-B1. Grain yield in wheat ( ... ...

Abstract	KEY MESSAGE: Quantitative trait locus (QTL) mapping of 15 yield component traits in a German multi-founder population identified eight QTL each controlling ≥2 phenotypes, including the genetic loci Rht24, WAPO-A1 and WAPO-B1. Grain yield in wheat (Triticum aestivum L.) is a polygenic trait representing the culmination of many developmental processes and their interactions with the environment. Toward maintaining genetic gains in yield potential, ‘reductionist approaches’ are commonly undertaken by which the genetic control of yield components, that collectively determine yield, are established. Here we use an eight-founder German multi-parental wheat population to investigate the genetic control and phenotypic trade-offs between 15 yield components. Increased grains per ear was significantly positively correlated with the number of fertile spikelets per ear and negatively correlated with the number of infertile spikelets. However, as increased grain number and fertile spikelet number per ear were significantly negatively correlated with thousand grain weight, sink strength limitations were evident. Genetic mapping identified 34 replicated quantitative trait loci (QTL) at two or more test environments, of which 24 resolved into eight loci each controlling two or more traits—termed here ‘multi-trait QTL’ (MT-QTL). These included MT-QTL associated with previously cloned genes controlling semi-dwarf plant stature, and with the genetic locus Reduced height 24 (Rht24) that further modulates plant height. Additionally, MT-QTL controlling spikelet number traits were located to chromosome 7A encompassing the gene WHEAT ORTHOLOG OF APO1 (WAPO-A1), and to its homoeologous location on chromosome 7B containing WAPO-B1. The genetic loci identified in this study, particularly those that potentially control multiple yield components, provide future opportunities for the targeted investigation of their underlying genes, gene networks and phenotypic trade-offs, in order to underpin further genetic gains in yield.
Keywords	Triticum aestivum ; genes ; grain yield ; loci ; phenotype ; plant height ; quantitative trait loci ; quantitative traits ; spikelets ; wheat ; yield components
Language	English
Dates of publication	2021-05
Size	p. 1435-1454.
Publishing place	Springer Berlin Heidelberg
Document type	Article
Note	NAL-AP-2-clean
ZDB-ID	2170-2
ISSN	1432-2242 ; 0040-5752
ISSN (online)	1432-2242
ISSN	0040-5752
DOI	10.1007/s00122-021-03781-7
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Article: Septoria Nodorum Blotch of Wheat: Disease Management and Resistance Breeding in the Face of Shifting Disease Dynamics and a Changing Environment.

Downie, Rowena C / Lin, Min / Corsi, Beatrice / Ficke, Andrea / Lillemo, Morten / Oliver, Richard P / Phan, Huyen T T / Tan, Kar-Chun / Cockram, James

Phytopathology

2021 Volume 111, Issue 6, Page(s) 906–920

Abstract: ... The ... ...

Abstract	The fungus
MeSH term(s)	Ascomycota ; Disease Management ; Disease Resistance/genetics ; Plant Breeding ; Plant Diseases ; Quantitative Trait Loci ; Triticum/genetics
Language	English
Publishing date	2021-07-27
Publishing country	United States
Document type	Journal Article ; Review
ZDB-ID	208889-7
ISSN	1943-7684 ; 0031-949X
ISSN (online)	1943-7684
ISSN	0031-949X
DOI	10.1094/PHYTO-07-20-0280-RVW
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Article ; Online: Longer epidermal cells underlie a quantitative source of variation in wheat flag leaf size.

Zanella, Camila M / Rotondo, Marilena / McCormick-Barnes, Charlie / Mellers, Greg / Corsi, Beatrice / Berry, Simon / Ciccone, Giulia / Day, Rob / Faralli, Michele / Galle, Alexander / Gardner, Keith A / Jacobs, John / Ober, Eric S / Sánchez Del Rio, Ana / Van Rie, Jeroen / Lawson, Tracy / Cockram, James

The New phytologist

2022 Volume 237, Issue 5, Page(s) 1558–1573

Abstract	The wheat flag leaf is the main contributor of photosynthetic assimilates to developing grains. Understanding how canopy architecture strategies affect source strength and yield will aid improved crop design. We used an eight-founder population to investigate the genetic architecture of flag leaf area, length, width and angle in European wheat. For the strongest genetic locus identified, we subsequently created a near-isogenic line (NIL) pair for more detailed investigation across seven test environments. Genetic control of traits investigated was highly polygenic, with colocalisation of replicated quantitative trait loci (QTL) for one or more traits identifying 24 loci. For QTL QFll.niab-5A.1 (FLL5A), development of a NIL pair found the FLL5A+ allele commonly conferred a c. 7% increase in flag and second leaf length and a more erect leaf angle, resulting in higher flag and/or second leaf area. Increased FLL5A-mediated flag leaf length was associated with: (1) longer pavement cells and (2) larger stomata at lower density, with a trend for decreased maximum stomatal conductance (G
MeSH term(s)	Chromosome Mapping ; Triticum/anatomy & histology ; Quantitative Trait Loci/genetics ; Plant Leaves/anatomy & histology ; Phenotype ; Epidermal Cells
Language	English
Publishing date	2022-12-28
Publishing country	England
Document type	Journal Article ; Research Support, Non-U.S. Gov't
ZDB-ID	208885-x
ISSN	1469-8137 ; 0028-646X
ISSN (online)	1469-8137
ISSN	0028-646X
DOI	10.1111/nph.18676
Database	MEDical Literature Analysis and Retrieval System OnLINE

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Article ; Online: Identification of eight QTL controlling multiple yield components in a German multi-parental wheat population, including Rht24, WAPO-A1, WAPO-B1 and genetic loci on chromosomes 5A and 6A.

TAG. Theoretical and applied genetics. Theoretische und angewandte Genetik

2021 Volume 134, Issue 5, Page(s) 1435–1454

Abstract: Key message: Quantitative trait locus (QTL) mapping of 15 yield component traits in a German multi-founder population identified eight QTL each controlling ≥2 phenotypes, including the genetic loci Rht24, WAPO-A1 and WAPO-B1. Grain yield in wheat ( ... ...

Abstract	Key message: Quantitative trait locus (QTL) mapping of 15 yield component traits in a German multi-founder population identified eight QTL each controlling ≥2 phenotypes, including the genetic loci Rht24, WAPO-A1 and WAPO-B1. Grain yield in wheat (Triticum aestivum L.) is a polygenic trait representing the culmination of many developmental processes and their interactions with the environment. Toward maintaining genetic gains in yield potential, 'reductionist approaches' are commonly undertaken by which the genetic control of yield components, that collectively determine yield, are established. Here we use an eight-founder German multi-parental wheat population to investigate the genetic control and phenotypic trade-offs between 15 yield components. Increased grains per ear was significantly positively correlated with the number of fertile spikelets per ear and negatively correlated with the number of infertile spikelets. However, as increased grain number and fertile spikelet number per ear were significantly negatively correlated with thousand grain weight, sink strength limitations were evident. Genetic mapping identified 34 replicated quantitative trait loci (QTL) at two or more test environments, of which 24 resolved into eight loci each controlling two or more traits-termed here 'multi-trait QTL' (MT-QTL). These included MT-QTL associated with previously cloned genes controlling semi-dwarf plant stature, and with the genetic locus Reduced height 24 (Rht24) that further modulates plant height. Additionally, MT-QTL controlling spikelet number traits were located to chromosome 7A encompassing the gene WHEAT ORTHOLOG OF APO1 (WAPO-A1), and to its homoeologous location on chromosome 7B containing WAPO-B1. The genetic loci identified in this study, particularly those that potentially control multiple yield components, provide future opportunities for the targeted investigation of their underlying genes, gene networks and phenotypic trade-offs, in order to underpin further genetic gains in yield.
MeSH term(s)	Chromosome Mapping/methods ; Chromosomes, Plant/genetics ; Gene Expression Regulation, Plant ; Genetics, Population ; Genome, Plant ; Genome-Wide Association Study ; Plant Breeding ; Plant Proteins/genetics ; Plant Proteins/metabolism ; Polymorphism, Single Nucleotide ; Quantitative Trait Loci ; Triticum/classification ; Triticum/genetics ; Triticum/growth & development ; Triticum/metabolism
Chemical Substances	Plant Proteins
Language	English
Publishing date	2021-03-12
Publishing country	Germany
Document type	Journal Article
ZDB-ID	2170-2
ISSN	1432-2242 ; 0040-5752
ISSN (online)	1432-2242
ISSN	0040-5752
DOI	10.1007/s00122-021-03781-7
Database	MEDical Literature Analysis and Retrieval System OnLINE

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