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  1. AU="El-Helou, Assaad E"
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  1. Article ; Online: Electric Field- and Current-Induced Electroforming Modes in NbO

    Nandi, Sanjoy Kumar / Nath, Shimul Kanti / El-Helou, Assaad E / Li, Shuai / Ratcliff, Thomas / Uenuma, Mutsunori / Raad, Peter E / Elliman, Robert G

    ACS applied materials & interfaces

    2020  Volume 12, Issue 7, Page(s) 8422–8428

    Abstract: Electroforming is used to initiate the memristive response in metal/oxide/metal devices by creating a filamentary conduction path in the oxide film. Here, we use a simple photoresist-based detection technique to map the spatial distribution of conductive ...

    Abstract Electroforming is used to initiate the memristive response in metal/oxide/metal devices by creating a filamentary conduction path in the oxide film. Here, we use a simple photoresist-based detection technique to map the spatial distribution of conductive filaments formed in Nb/NbO
    Language English
    Publishing date 2020-02-07
    Publishing country United States
    Document type Journal Article
    ISSN 1944-8252
    ISSN (online) 1944-8252
    DOI 10.1021/acsami.9b20252
    Database MEDical Literature Analysis and Retrieval System OnLINE

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  2. Article: Electric Field- and Current-Induced Electroforming Modes in NbOx

    Nandi, Sanjoy Kumar / Nath, Shimul Kanti / El-Helou, Assaad E / Li, Shuai / Ratcliff, Thomas / Uenuma, Mutsunori / Raad, Peter E / Elliman, Robert G

    ACS applied materials & interfaces. 2020 Jan. 28, v. 12, no. 7

    2020  

    Abstract: Electroforming is used to initiate the memristive response in metal/oxide/metal devices by creating a filamentary conduction path in the oxide film. Here, we use a simple photoresist-based detection technique to map the spatial distribution of conductive ...

    Abstract Electroforming is used to initiate the memristive response in metal/oxide/metal devices by creating a filamentary conduction path in the oxide film. Here, we use a simple photoresist-based detection technique to map the spatial distribution of conductive filaments formed in Nb/NbOx/Pt devices, and correlate these with current–voltage characteristics and in situ thermoreflectance measurements to identify distinct modes of electroforming in low- and high-conductivity NbOx films. In low-conductivity films, the filaments are randomly distributed within the oxide film, consistent with a field-induced weakest-link mechanism, while in high-conductivity films they are concentrated in the center of the film. In the latter case, the current–voltage characteristics and in situ thermoreflectance imaging show that electroforming is associated with current bifurcation into regions of low and high current density. This is supported by finite element modeling of the current distribution and shown to be consistent with predictions of a simple core–shell model of the current distribution. These results clearly demonstrate two distinct modes of electroforming in the same material system and show that the dominant mode depends on the conductivity of the film, with field-induced electroforming dominant in low-conductivity films and current bifurcation-induced electroforming dominant in high-conductivity films.
    Keywords electric field ; finite element analysis ; image analysis ; models ; prediction
    Language English
    Dates of publication 2020-0128
    Size p. 8422-8428.
    Publishing place American Chemical Society
    Document type Article
    ISSN 1944-8252
    DOI 10.1021/acsami.9b20252
    Database NAL-Catalogue (AGRICOLA)

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