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  1. Article ; Online: Corrigendum to 'Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual lattice' Ultramicroscopy 253 (2023) 113778>.

    Cherkashin, N / Louiset, A / Chmielewski, A / Kim, D J / Dubourdieu, C / Schamm-Chardon, S

    Ultramicroscopy

    2023  Volume 254, Page(s) 113801

    Language English
    Publishing date 2023-06-26
    Publishing country Netherlands
    Document type Published Erratum
    ZDB-ID 1479043-9
    ISSN 1879-2723 ; 0304-3991
    ISSN (online) 1879-2723
    ISSN 0304-3991
    DOI 10.1016/j.ultramic.2023.113801
    Database MEDical Literature Analysis and Retrieval System OnLINE

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  2. Article ; Online: Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual lattice.

    Cherkashin, N / Louiset, A / Chmielewski, A / Kim, D J / Dubourdieu, C / Schamm-Chardon, S

    Ultramicroscopy

    2023  Volume 253, Page(s) 113778

    Abstract: A method for the reciprocal space treatment of high-resolution transmission electron microscopy (HR-TEM) and high-resolution scanning transmission electron microscopy (HR-STEM) images has been developed. Named "Absolute strain" (AbStrain), it allows for ... ...

    Abstract A method for the reciprocal space treatment of high-resolution transmission electron microscopy (HR-TEM) and high-resolution scanning transmission electron microscopy (HR-STEM) images has been developed. Named "Absolute strain" (AbStrain), it allows for quantification and mapping of interplanar distances and angles, displacement fields and strain tensor components with reference to a user-defined Bravais lattice and with their corrections from the image distortions specific to HR-TEM and HR-STEM imaging. We provide the corresponding mathematical formalism. AbStrain goes beyond the restriction of the existing method known as geometric phase analysis by enabling direct analysis of the area of interest without the need for reference lattice fringes of a similar crystal structure on the same field of view. In addition, for the case of a crystal composed of two or more types of atoms, each with its own sub-structure constraint, we developed a method named "Relative displacement" for extracting sub-lattice fringes associated to one type of atom and measuring atomic columns displacements associated to each sub-structure with reference to a Bravais lattice or to another sub-structure. The successful application of AbStrain and Relative displacement to HR-STEM images of functional oxide ferroelectric heterostructures is demonstrated.
    Language English
    Publishing date 2023-06-10
    Publishing country Netherlands
    Document type Journal Article
    ZDB-ID 1479043-9
    ISSN 1879-2723 ; 0304-3991
    ISSN (online) 1879-2723
    ISSN 0304-3991
    DOI 10.1016/j.ultramic.2023.113778
    Database MEDical Literature Analysis and Retrieval System OnLINE

    Full text online

    More links

    Kategorien

    Order via subito

    This service is chargeable due to the Delivery terms set by subito. Orders including an article and supplementary material will be classified as separate orders. In these cases, fees will be demanded for each order.

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